The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions The meeting is a IEEE conference, sponsored by the IEEE Electron Devices Society.
The conference will be held from 6 to 9 April 2020, at the
University of Edinburgh
For more information on ICMTS including information on past conferences, please visit the permanent ICMTS website.
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