The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions The meeting is a IEEE conference, sponsored by the IEEE Electron Devices Society.
The conference will be held from 6 to 9 April 2020, at the University of Edinburgh.
The Conference Venue is: South Hall Complex, Pollock Halls, 18 Holyrood Park Road, Edinburgh, EH16 5AU, Scotland, UK
For more information on ICMTS including information on past conferences, please visit the permanent ICMTS website.
Please follow the ICMTS on LinkedIn