The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions The meeting is a IEEE conference, sponsored by the IEEE Electron Devices Society.
The conference will be held from 19 to 21 March 2019, at the
Kitakyushu International Conference Center
3-9-30 Asano, Kokurakita-ku, Kitakyushu-shi, Fukuoka 802-0001
For more information on ICMTS including past conferences information, please visit the permanent ICMTS website.
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