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Note: This program is subject to change without notice. Final printed version of program will be available at the conference.

Tutorial (March 19)

08:30 Registration
08:50 Welcome
09:00 Hans Tuinhout: An Introduction to Microelectronic Test Structures
10:00 Break
10:20 Emanuel Tutuc: Interlayer Tunneling Field Effect Transistors
11:20 James J. Coleman: Silicon Photonics
12:20 Lunch
14:00 Fred Mancoff: Characterization of Spin-Transfer Torque Magnetoresistive Random Access Memory Performance from Single Magnetic Tunnel Junction Bits up to Large Scale Arrays
15:00 Break
15:20 Jason Reifsnider: Foundry Characterization for Product Improvement and Yield Enhancement
16:20 Andreas Kerber: Test Structure Innovation for Discrete Device and Digital Circuit Degradation in Advanced CMOS Technology Nodes
17:20 Closing
17:30 Reception