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Note: This program is subject to change without notice. Final printed version of program will be available at the conference.

Tutorial (March 18)

08:30 Registration
09:00 Welcome
09:10 Ryoichi Nakamura: 3D integration technology for CMOS image sensors and future prospects
10:00 Coffee Break
10:20 Yuichiro Mitani: 3D NAND Flash Memory - Electrical and Physical characterizations for Memory Cell Reliability
11:20 Ichiro Omura: Power Semiconductor Device Basics [tentative title]
12:20 Lunch
13:40 Stewart Smith: Microelectronic Test Structure Fundamentals
14:40 Bill Verzi: The Fundamentals of Measurement Theory
15:40 Coffee Break
16:00 Colin McAndrew: Modeling Methods Fundamentals, and Why What You Learned in School About Transistor Capacitances is Wrong!
17:00 Toru Nakura: Power Supply Noise Suppression and Emulation to Improve Reliability of LSI operations
18:00 Closing
18:05 Reception