Note: This program is subject to change without notice. Final printed version of program will be available at the conference.
Tutorial (March 19)
|09:00||Hans Tuinhout: An Introduction to Microelectronic Test Structures|
|10:20||Emanuel Tutuc: Interlayer Tunneling Field Effect Transistors|
|11:20||James J. Coleman: Silicon Photonics|
|14:00||Fred Mancoff: Characterization of Spin-Transfer Torque Magnetoresistive Random Access Memory Performance from Single Magnetic Tunnel Junction Bits up to Large Scale Arrays|
|15:20||Jason Reifsnider: Foundry Characterization for Product Improvement and Yield Enhancement|
|16:20||Andreas Kerber: Test Structure Innovation for Discrete Device and Digital Circuit Degradation in Advanced CMOS Technology Nodes|