Note: This program is subject to change without notice. Final printed version of program will be available at the conference.
Tutorial (March 18)
| 08:30 | Registration |
| 09:00 | Welcome |
| 09:10 | Ryoichi Nakamura: 3D integration technology for CMOS image sensors and future prospects |
| 10:00 | Coffee Break |
| 10:20 | Yuichiro Mitani: 3D NAND Flash Memory - Electrical and Physical characterizations for Memory Cell Reliability |
| 11:20 | Ichiro Omura: Power Semiconductor Device Basics [tentative title] |
| 12:20 | Lunch |
| 13:40 | Stewart Smith: Microelectronic Test Structure Fundamentals |
| 14:40 | Bill Verzi: The Fundamentals of Measurement Theory |
| 15:40 | Coffee Break |
| 16:00 | Colin McAndrew: Modeling Methods Fundamentals, and Why What You Learned in School About Transistor Capacitances is Wrong! |
| 17:00 | Toru Nakura: Power Supply Noise Suppression and Emulation to Improve Reliability of LSI operations |
| 18:00 | Closing |
| 18:05 | Reception |
