Monday, Mar 23
|
| 08:55
| Welcome
|
| 09:00
| Tutorial 1
|
| 09:50
| Tutorial 2
|
| 10:40
| Break
|
| 11:00
| Tutorial 3
|
| 11:50
| Lunch
|
| 13:20
| Tutorial 4
|
| 14:10
| Tutorial 5
|
| 15:00
| Break
|
| 15:20
| Tutorial 6
|
| 16:10
| Tutorial 7
|
| 17:00
| Close
|
| 17:30
| Reception for All Attendees
|
|
Tuesday, Mar 24
|
| 09:00
| Welcome
|
| 09:10
| Session 1: Circuits for Test and Computation
|
| 10:50
| Session 2: AI and Machine Learning
|
| 12:10
| Lunch
|
| 13:30
| Session 3: Device Characterization
|
| 15:10
| Sponsors
|
| 15:50
| Session 4: Process Characterization
|
|
Wednesday, Mar 25
|
| 09:00
| Invited Talk 1
|
| 10:00
| Session 5: MEMS and Sensors
|
| 11:20
| Session 6: Memory
|
| 12:40
| Lunch
|
| 14:00
| Session 7: Reliability
|
| 15:40
| ICMTS 2027
|
| 15:50
| Session 8: ESD
|
| 16:50
| End of Day 2
|
| 17:30
| Banquet
|
|
Thursday, Mar 26
|
| 08:45
| Invited Talk 2
|
| 09:35
| Session 9: Cryogenics
|
| 10:50
| Session 10: Power Devices
|
| 12:10
| Best Paper Award, Closing
|
| 12:20
| Lunch and Excursion
|
|
