The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions The meeting is an IEEE technically sponsored conference, sponsored by the IEEE Electron Devices Society.
Features of the ICMTS 2023
A Tutorial Short Course will precede the conference sessions. Several of the best measurement, equipment,
design, and manufacturing experts, will participate to the equipment exhibition and presentations.
A Best Paper award will be presented by the Technical Program Committee. The IEEE Electron Devices Society is the co-sponsor, and all published papers will be submitted for possible inclusion on IEEE Xplore(R)
For more information on ICMTS including past conferences information, please visit the permanent ICMTS website.and / or contact us via E-Mail email@example.com.
Please follow the ICMTS on LinkedIn