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Note: This program is subject to change without notice. Final printed version of program will be available at the conference.

Tutorial (March 27)

08:00 Registration
08:50 Welcome
09:00 Hans Tuinhout: Challenges and solutions for characterization of semiconductor device matching and variability
09:55 Break
10:00 Hitoshi Wakabayashi: Advanced CMOS Technologies including 3D-Stacked 2D-FETs
10:55 Break
11:00 Masataka Higashiwaki: Current status of gallium oxide material and device technologies
11:55 Lunch
13:25 Brad Smith: Test Structures: The Intersection of Design and Test
14:20 Break
14:25 Masashi Bando: Recent progress in CMOS image sensor technology and future prospect
15:20 Break
15:25 Noboru Shibata: History of 2D/3D Multi-Level Flash Memory Design Technology
16:20 Break
16:25 Hiroshi Toshiyoshi: Design and test for MEMS vibrational energy harvesters
17:20 Break
17:50 Welcome Reception