Challenges and solutions for characterization of semiconductor device matching and variability
| Presenter: |
Hans Tuinhout |
NXP Semiconductors |
| Start: |
09:00 (55 minutes) |
Abstract
This tutorial will discuss techniques for characterization of small parametric differences of semiconductor components for high-precision analog electronic circuit design. After an introduction on the required orders of magnitude for modeling and characterization, way to look at measurement accuracy and short-term repeatability capabilities of semiconductor test equipment will be discussed. Then, the possibilities and limitations of statistics will be briefly touched upon, after which the focus will be on the tradeoff of measurement time vs. repeatability for high precision parametric device measurement for characterization of matching.
