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Test Structures: The Intersection of Design and Test

Presenter: Brad Smith NXP Semiconductors
Start: 13:25 (55 minutes)

Abstract

This talk will cover the basics of test structure design and test, emphasizing how the two are inter-related. Often, there are no “right” answers in test structure design, only trade-offs. Methods for how to make those decisions will be covered, the most important of which is letting the desired output of a test structure define its design and testing.